Detection of Corrosion Processes in Metallic Samples of Copper by CND Control

DOI: 10.4236/msa.2013.44029   PDF   HTML   XML   3,248 Downloads   5,920 Views   Citations


When diffusing object is illuminated by a laser, it gives the impression of being covered with a very fine grain structure. This structure commonly is nothing but the result of the interference of random waves from the object. In the early years of the invention of the laser sources, the CND control was considered a birth which severely affects the image resolution. Various studies have been developed to remove. The development of new systems for capturing images CCD coupled with tools image processing techniques has made the CND control most interesting for industrial control real-time and non-destructive. Metrology of photography and optic interferometry are two methods that provide the ability to analyze and determine deformations of structures. The CND technique is the most answered and more particularly the technical of interferometry. This method is simple to implement, follow the evolution of the interference of a speckle fields diffracted by an object and a reference fields. Images are recorded by a CCD camera and digitally processed by computer to generate correlograms from which is extracted the gauging. CND techniques have provided only qualitative measures as correlation fringes. The application process and digital image processing techniques to measure phase yielded quantitative measures. Among the techniques for calculating phase, the phase shift method is the most used because it is the most accurate. This technique is based on a combination of shifted interferograms to extract the phase. It requires a phase modulator for generating phase-shifted interferograms speckle and an algorithm for calculating the phase.

Share and Cite:

R. Daira, V. Chalvedin and M. Boulhout, "Detection of Corrosion Processes in Metallic Samples of Copper by CND Control," Materials Sciences and Applications, Vol. 4 No. 4, 2013, pp. 238-245. doi: 10.4236/msa.2013.44029.

Conflicts of Interest

The authors declare no conflicts of interest.


[1] M. G. Fontana and N. D. Greene, “Corrosion Engineering,” 3rd Edition, McGraw-Hill, New York, 1986.
[2] P. Hariharan, “Optical Holography: Principles, Techniques, and Applications,” 2nd Edition, Cambridge University Press, New York, 1996. doi:10.1017/CBO9781139174039
[3] D. Mayorga-Cruz, P. A. Ma′rquez-Aguilar, O. Sarmiento-Marti′nez and J. Uruchurtu-Chavari′n, “Evaluation of Corrosion in Electrochemical System Using Michelson Interferometry,” Optics and Lasers in Engineering, Vol. 45, No. 1, 2007, pp. 140-144. doi:10.1016/j.optlaseng.2006.02.001
[4] K. Habib, “In Situ Measurement of Oxide Film Growth on Aluminium Samples by Holographic Interferometry,” Corrosion Science, Vol. 43, No. 3, 2001, pp. 449-455. doi:10.1016/S0010-938X(00)00094-9
[5] K. Habib, “Model of Holographic Interferometry of Anodic Dissolution of Metals in Aqueous Solution,” Optics and Lasers in Engineering, Vol. 18, No. 2, 1993, pp. 115-120. doi:10.1016/0143-8166(93)90016-E
[6] D. Mayorga-Cruz, J. Uruchurtu-Chavari′n, O. Sarmiento-Martinez and P. A. Marquez-Aguilar, “Estimation of Corrosion Parameters in Electrochemical System Using Michelson Interferometry,” Proceedings of the 5th Symposium Optics in Industry, 10 February 2006. doi:10.1117/12.674445

comments powered by Disqus

Copyright © 2020 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.