American Journal of Plant Sciences

Volume 2, Issue 3 (September 2011)

ISSN Print: 2158-2742   ISSN Online: 2158-2750

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Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line

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DOI: 10.4236/ajps.2011.23049    4,839 Downloads   9,901 Views   Citations

ABSTRACT

Sixty-five random amplified polymorphic DNA (RAPD) primers were used for the detection of polymorphism among recipient and donor parents and their isogenic lines linked to leaf rust resistance genes, Lr9 and the resistant gene in kharchia local mutant KLM4-3B. Three primers showed polymorphism among recurrent parent, donor parent and isogenic lines.

Cite this paper

Dhillon, N. and Dhaliwal, H. (2011) Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line. American Journal of Plant Sciences, 2, 433-437. doi: 10.4236/ajps.2011.23049.

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