Author(s)

Kun-Lin Lin^*

National Nano Device Laboratories, Hsinchu.

Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with <100> alignment; the other, unknown, was the Ti_xO_y phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.

Phase Identification, Transmission Electron Microscopy, Selected Area Diffraction Pattern, Energy Dispersive Spectroscopy

Lin, K. (2014) Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM. Microscopy Research, 2, 57-66. doi: 10.4236/mr.2014.24008.