Journal of Crystallization Process and Technology

Journal of Crystallization Process and Technology

ISSN Print: 2161-7678
ISSN Online: 2161-7686
www.scirp.org/journal/jcpt
E-mail: jcpt@scirp.org
Citations    
"A New Method for Research of Grown-In Microdefects in Dislocation-Free Silicon Single Crystals"
written by V.I Talanin, I.E Talanin, N.Ph Ustimenko,
published by Journal of Crystallization Process and Technology, Vol.1 No.2, 2011
has been cited by the following article(s):
  • Google Scholar
  • CrossRef
[1] The Formation of Structural Imperfections in Semiconductor Silicon
2018
[2] Algorithm for Calculating the Initial Defect Structure of Semiconductor Silicon
2017
[3] Диффузионная модель образования ростовых микродефектов: новый подход к дефектообразованию в кристаллах (Обзор)
Физика твердого тела, 2016
[4] Diffusion model of the formation of growth microdefects: A new approach to defect formation in crystals (Review)
Physics of the Solid State, 2016
[5] Diffusion model of the formation of growth microdefects: A new approach to defect formation in crystals
Physics of the Solid State, 2016
[6] Диффузионная модель образования ростовых микродефектов: новый подход к дефектообразованию в кристаллах (О б з о р)
2016
[7] Diffusion model of the formation of growth microdefects as applied to the description of defect formation in heat-treated silicon single crystals
Physics of the Solid State, 2013
[8] Применение диффузионной модели образования ростовых микродефектов для описания дефектообразования в термообработанных монокристаллах кремния
Физика твердого тела, 2013
[9] A kinetic model of the formation and growth of interstitial dislocation loops in dislocation free silicon single crystals
Journal of Crystal Growth, 2012
[10] Structural Scheme of Information System for Defect Engineering of Dislocation-free Silicon Single Crystals
Science and Technology, 2012
[11] The diffusion model of grown-in microdefects formation during crystallization of dislocation-free silicon single crystals
2012
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top