Characterisation of Thin Films Using a Coherence Scanning Interferometry

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ISSN Print: 2327-6045
ISSN Online: 2327-6053
www.scirp.org/journal/msce
E-mail: msce@scirp.org

"Characterisation of Thin Films Using a Coherence Scanning Interferometry"
written by Yang Yu, Daniel Mansfield,
published by Journal of Materials Science and Chemical Engineering, Vol.3 No.1, 2015

has been cited by the following article(s):

[1]	用于表面形貌测量的扫描白光干涉技术进展
	Laser & …, 2023

[2]	Applications of coherence scanning interferometry in additive manufacturing
	2022

[3]	A review on the prominence of porosity in tungsten oxide thin films for electrochromism
	2021

[4]	Coherence scanning interferometry
	2020

[5]	Thin film CDTE solar cells deposited by pulsed DC magnetron sputtering
	2017

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[1]	用于表面形貌测量的扫描白光干涉技术进展 Laser & Optoelectronics Progress, 2023 DOI:10.3788/LOP223228

[2]	A review on the prominence of porosity in tungsten oxide thin films for electrochromism Ionics, 2021 DOI:10.1007/s11581-021-04035-8