Feasibility Study to Evaluate Lattice-Space Changing of a Step-Graded SiGe/Si (110) Using STEM Moiré

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Journal of Materials Science and Chemical Engineering

ISSN Print: 2327-6045
ISSN Online: 2327-6053
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"Feasibility Study to Evaluate Lattice-Space Changing of a Step-Graded SiGe/Si (110) Using STEM Moiré"
written by Junji Yamanaka, Mai Shirakura, Chiaya Yamamoto, Kei Sato, Takane Yamada, Kosuke O. Hara, Keisuke Arimoto, Kiyokazu Nakagawa, Akimitsu Ishizuka, Kazuo Ishizuka,
published by Journal of Materials Science and Chemical Engineering, Vol.6 No.7, 2018

has been cited by the following article(s):

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CrossRef

[1]	Principles of Electron Optics, Volume 3: Fundamental Wave Optics
	2022

[2]	Moiré fringe method via scanning transmission electron microscopy
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[3]	Introduction to strain characterization methods in Transmission Electron Microscopy
	Advances in Imaging and Electron Physics, 2021

[4]	Scanning Transmission Electron Microscopy Moiré sampling Geometrical Phase Analysis (STEM Moiré GPA)
	Advances in Imaging and Electron Physics, 2021

[5]	Discrimination between Coherent and Incoherent Interfaces using STEM Moiré
	2021

[6]	Introduction to strain characterization method in Transmission Electron Microscopy
	2021

[7]	Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopy
	2020

[8]	Optimization of the sampling parameters for STEM Moiré GPA strain characterization technique
	Ultramicroscopy, 2019

[9]	Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe/Si (110) Using STEM Moiré Observation and its Image Analysis
	2019

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