The Use of Light Diffracted from Grating Etched onto the Backside Surface of an Atomic Force Microscope Cantilever Increases the Force Sensitivity

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ISSN Print: 2161-4881
ISSN Online: 2161-489X
www.scirp.org/journal/jsemat
E-mail: jsemat@scirp.org

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"The Use of Light Diffracted from Grating Etched onto the Backside Surface of an Atomic Force Microscope Cantilever Increases the Force Sensitivity"
written by Sergey K. Sekatskii, Mounir Mensi, Andrey G. Mikhaylov, Giovanni Dietler,
published by Journal of Surface Engineered Materials and Advanced Technology, Vol.3 No.4A, 2013

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[1]	Design and Analysis of a Robust Gyroscope via Grating SPP on Cantilever Sensing and Imaging, 2024 DOI:10.1007/s11220-024-00460-x