Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy

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ISSN Print: 2161-4881
ISSN Online: 2161-489X
www.scirp.org/journal/jsemat
E-mail: jsemat@scirp.org

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"Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy"
written by Kenny Lau, Yun Liu, Qian Li, Zhenrong Li, Ray L. Withers, Zhuo Xu,
published by Journal of Surface Engineered Materials and Advanced Technology, Vol.3 No.3, 2013

has been cited by the following article(s):

[1]	Ferroelectric switching phenomena in organic dielectrics and semiconductors
	2018

[2]	Optical and Electrical Properties of TiO2/Co/TiO2 Multilayer Films Grown by DC Magnetron Sputtering
	Advances in Condensed Matter Physics, 2018

[3]	Electrostatic and Kelvin Probe Force Microscopy for Domain Imaging of Ferroic Systems
	Nanoscale Ferroelectrics and Multiferroics: Key Processing and Characterization Issues, and Nanoscale Effects, Volume I & II, 2016

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