Investigating the Thermal Stress of Millisecond Pulsed Laser Irradiation on Charge-Coupled Devices

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ISSN Print: 2327-4352
ISSN Online: 2327-4379
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"Investigating the Thermal Stress of Millisecond Pulsed Laser Irradiation on Charge-Coupled Devices"
written by Chunxu Jiang, Yong Tan, Bo Peng, Guangyong Jin, Hongxing Cai, Zhong Lv,
published by Journal of Applied Mathematics and Physics, Vol.8 No.11, 2020

has been cited by the following article(s):

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[2]	Photoelectric detector surface damage state polarization imaging type detection system
	红外与激光工程, 2022

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[1]	光电探测器表面损伤状态偏振成像式探测系统 Infrared and Laser Engineering, 2022 DOI:10.3788/IRLA20210629