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Journal of Crystallization Process and Technology

Journal of Crystallization Process and Technology

Journal of Crystallization Process and Technology

ISSN Print: 2161-7678
ISSN Online: 2161-7686
www.scirp.org/journal/jcpt
E-mail: jcpt@scirp.org
"Enhanced Ferroelectric Properties of Multilayer SBT-BTN Thin Films for NVRAM Applications"
written by Oleksandr Khorkhordin, Chia-Pin Yeh, Bodo Kalkofen, Edmund Burte,
published by Journal of Crystallization Process and Technology, Vol.5 No.4, 2015
has been cited by the following article(s):
  • Google Scholar
  • CrossRef
[1] Effect of V 2 O 5 B-site substitution on the microstructure, Raman spectrum, and dielectric properties of SrBi 2 Ta 2 O 9 ceramics
2020
[2] Структурные и электрические характеристики двухслойных тонких пленок Bi 4 Ti 3 O 12/(Ba, Sr) TiO 3, осажденных на кремниевую подложку методом …
Физика твердого …, 2019
[3] Structural and Electric Characteristics of Two-Layer Bi4Ti3O12/(Ba,Sr)TiO3 Thin Films Deposited on a Silicon Substrate by Radio-Frequency Sputtering at …
2019
[4] Lattice Structure and Dynamics of Two-Layer Heterostructures of Barium–Strontium Titanate and Layered Bismuth Titanate of Various Thicknesses on a Magnesium …
2019
[5] Структура и динамика решетки двухслойных гетероструктур титаната бария-стронция и слоистого титаната висмута разной толщины на подложке окcида …
2019
[6] Структурные и электрические характеристики двухслойных тонких пленок Bi4Ti3O12/(Ba,Sr)TiO3, осажденных на кремниевую подложку методом …
2019
[7] Сегнетоэлектрические свойства многослойных тонких пленок титаната бария стронция и слоистого титаната висмута для использования в …
2018
[8] Electrical and ferroelectric properties of RF sputtered PZT/SBN on silicon for non-volatile memory applications
Materials Research Express, 2018
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