Author(s)

Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail

Department of Applied Physics and Electronic Engineering, Rajshahi University, Rajshahi, Bangladesh.

  The following article has been retracted due to the fact that the authors practise fraud. The scientific community takes a very strong view on this matter, and the Advances in Materials Physics and Chemistry treats all unethical behavior seriously. This paper published in Vol. 4 No. 10 194-202, 2014 has been removed from this site.

  Title: Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film

  Authors: Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail

E-Beam Deposition, Surface Morphology, Thin Films, EDX, Atomic Force Microscopy, SEM, Annealing, Electrical and Optical Properties

Saklayen, G. , Islam, S. , Rahman, F. and Ismail, A. (2014) Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film. Advances in Materials Physics and Chemistry, 4, 194-202. doi: 10.4236/ampc.2014.410023.