Author(s)

Zongxin Wang, Lizhi You

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For a compact millimeter wave imaging system it is very important to design every component into small size, for the components in a millimeter wave system are usually much larger than those in an optical imaging system due to rela-tively long wave lengths. In this paper, we suggest a kind of binary diffractive lens (BDL) designed using double nega-tive materials (DNG) as the objective lens for a millimeter wave imaging system. The DNG-BDL has not only the ad-vantage of low profile but also small f number, which will be benefit for constructing a compact millimeter wave imaging system. Several DNG-BDL are designed and analyzed using the FDTD method. The numerical results of the focal plane field of the DNG-BDL are presented, which show that the DNG-BDL with small f number has relatively better focusing characteristic than that of a double positive BDL with same f number.

Millimeter Wave Imaging, Binary Diffractive Lens, Double Negative Material

Z. Wang and L. You, "Analysis of the Focusing Characteristics of Double Negative Binary Diffractive Lens," Journal of Electromagnetic Analysis and Applications, Vol. 2 No. 9, 2010, pp. 557-562. doi: 10.4236/jemaa.2010.29072.