Volume 1, Number 5A, October 2013 (Special Issue on Energy Materials)

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Detailed Micro Raman Spectroscopy Analysis of Doped Silicon Thin Film Layers and Its Feasibility for Heterojunction Silicon Wafer Solar Cells

Z. P. Ling, J. Ge, R. Stangl, A. G. Aberle, T. Mueller

Abstract | References Full-Text HTML   Pub. Date: October 17, 2013

DOI: 10.4236/msce.2013.15A001  4,709 Downloads  10,321 Views   Citations

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