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Volume 8, Number 2, June 2018 (Special Issue on )
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Investigation and Comparison of the DIBL Parameter and Thermal Effects of SOD Transistors and SOI Transistors and Improving Them with the Change of Their BOX Thicknesses ()
Nooshien Laderian, Arash Daghighi
Abstract | References Full-Text HTML XML Pub. Date: June 29, 2018
DOI: 10.4236/jectc.2018.82002 318 Downloads 519 Views Citations This article belongs to the Special Issue on
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