Interfacial Actions and Adherence of an Interpenetrating Polymer Network Thin Film on Aluminum Substrate
Weiwei Cui, Dongyan Tang, Jie Liu, Fan Yang
DOI: 10.4236/jsemat.2011.13013   PDF    HTML     4,751 Downloads   8,689 Views   Citations


The interpenetrating polymer networks (IPN) thin film with the –C=O group in one network and the terminal –N=C=O group in another network on an aluminum substrate to reinforce the adherence between IPN and aluminum through interfacial reactions, were obtained by dip-pulling the pretreated aluminum substrate into the viscous-controlled IPN precursors and by the following thinning treatment to the IPN film to a suitable thickness. The interfacial actions and the adhesion strengths of the IPN on the pretreated aluminum substrate were investigated by the X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR) and strain-stress(?-?) measurements. The XPS and FTIR detection results indicated that the elements’ contents of N, O, and Al varied from the depths of IPN. The in-terfacial reaction occurred between the –N=C=O group of IPN and the AlO(OH) of pretreated aluminum. The in-creased force constant for –C=O double bond and the lower frequency shift of –C=O stretching vibration absorption peak both verified the formation of hydrogen bond between the –OH group in AlO(OH) and the –C=O group in IPN. The adherence detections indicated that the larger amount of –N=C=O group in the IPN, the higher shear strengths between the IPN thin film and the aluminum substrate.

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W. Cui, D. Tang, J. Liu and F. Yang, "Interfacial Actions and Adherence of an Interpenetrating Polymer Network Thin Film on Aluminum Substrate," Journal of Surface Engineered Materials and Advanced Technology, Vol. 1 No. 3, 2011, pp. 89-94. doi: 10.4236/jsemat.2011.13013.

Conflicts of Interest

The authors declare no conflicts of interest.


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