Algorithms for Masking Pixel Defects at Low Exposure Conditions for CMOS Image Sensors
Vinesh Sukumar, Jason Tanner, Atif Sarwari, Herbert L Hess
DOI: 10.4236/eng.2010.24032   PDF    HTML     6,531 Downloads   10,842 Views   Citations

Abstract

This paper introduces certain innovative algorithms to mask for pixel defects seen in image sensors. Pixel defectivity rates scale with pixel architecture and process nodes. Smaller pixel and process nodes introduce more defects in manufacturing. Brief introduction to causes for pixel defectivity at lower pixel nodes is explained. Later in the paper, popular defect correction schemes used in image processing applications are discussed. A new approach for defect correction is presented and evaluated using images captured from an 8M Bayer image sensor. Experimentation for threshold evaluation is done and presented with practical results for better optimization of proposed algorithms. Experimental data shows that proposed defect corrections preserves a lot of edge details and corrects for bright and hot pixels/clusters, which are evaluated using histogram analysis.

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Sukumar, V. , Tanner, J. , Sarwari, A. and Hess, H. (2010) Algorithms for Masking Pixel Defects at Low Exposure Conditions for CMOS Image Sensors. Engineering, 2, 220-227. doi: 10.4236/eng.2010.24032.

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1] R. C. Gonzalez and R. E. Woods, “Digital Image Processing,” Addison-Wesley, MA, 1992.
[2] H. Wach et al., “Noise Modeling for Design and Simulation of Computational Imaging Systems,” Optical Pattern Recognition, XVI, Proceedings of SPIE, Vol. 5438, No. 159, 2004, pp. 159-170.
[3] Jean-Marc, Leger, Dominique et al., “Modulation Transfer Function Measurement Using Non Specific View,” Optical Engineering, Vol. 43, 2004, pp. 1355-1365.
[4] O. Hadar, M. Huber, R. Huber and A. Stern, “MTF as A Quality Measure for Compressed Images Transmitted Over Lossy Packet Network,” Optical Engineering, Vol. 40, No. 10, 2001, pp. 2134-2142.
[5] J. S. Lee and R. I. Hornsey, “Photoresponse of Photodiode Arrays for Solid State Image Sensors,” Journal of Vacuum Science and Technology, Vol. 18, No.2, 2000, pp. 621-625.
[6] Yadid-Pecht, “Geometrical Modulation Transfer Function for Different Pixel Active Area Shapes,” Optical Engineering, Vol. 39, No. 4, 2000, pp. 859-865.
[7] G. D. Boreman and A. Plogstedt, “Spatial Filtering by a Nonrectangular Detector,” Applications of Optical Engineering, Vol. 28, No. 6, 1994, pp. 3063-3071.

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