Electrical Performance Study of a Large Area Multicrystalline Silicon Solar Cell Using a Current Shunt and a Micropotentiometer

Abstract

In this paper, a new technique using a Current Shunt and a Micropotentiometer has been used to study the electrical performance of a large area multicrystalline silicon solar cell at outdoor conditions. The electrical performance is mainly described by measuring both cell short circuit current and open circuit voltage. The measurements of this cell by using multimeters suffer from some problems because the cell has high current intensity with low output voltage. So, the solar cell short circuit current values are obtained by measuring the voltage developed across a known resistance Current Shunt. Samples of the obtained current values are accurately calibrated by using a Micropotentiometer (μpot) thermal element (TE) to validate this new measuring technique. Moreover, the solar cell open circuit voltage has been measured. Besides, the cell output power has been calculated and can be correlated with the measured incident radiation.

Share and Cite:

H. Mageed, A. Zobaa, A. Ghitas, M. Raouf, M. Sabry, A. El-Rahman and M. Aziz, "Electrical Performance Study of a Large Area Multicrystalline Silicon Solar Cell Using a Current Shunt and a Micropotentiometer," Engineering, Vol. 2 No. 4, 2010, pp. 263-269. doi: 10.4236/eng.2010.24036.

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1] W. Jooss, K. Blaschek, R. Toelle, T.M. Bruton, P. Fath and E. Bucher, “17% Back Contact Buried Contact Solar cells,” Proceedings of the 16th EPVSC, Glasgow, 2000, pp. 1124-1127.
[2] D.L. Meier, H. P. Dabis, A. Shibata, T. Abe, K. Kinoshita, C. Bishop, S. Mahajan, A. Rohatgi, P. Doshi and M. Finnegan, “Self Doping Contacts and Associated Solar Cell Structures,” Proceedings of the 2nd WCPSEC, Vienna, 1998, pp. 1491-1494.
[3] K. Faika, M. Wagner, P. Fath and E. Bucher, “Simplification of EWT (Emitter-wrap Through) Solar Cell Fabrication Using Al-P-Codiffusion,” Proceedings of the 28th IEEE PVSC, Anchorage, 2000, pp. 176-179.
[4] A. Kress, P. Fath, G. Willeke and E. Bucher, “Low-cost Back Contact Silicon Solar Cells Applying the Emitter-wrap Through (EWT) Concept,” Proceedings of the 2nd WCPSEC, Vienna, 1998, pp. 1547-1550.
[5] W. Neu, A. Kress, W. Jooss, P. Fath and E. Bucher, “Low-cost Multicrystalline Back-contact Silicon Solar Cells with Screen Printed Metallization,” Solar Energy Materials & Solar Cells, 2002, pp. 139-146.
[6] J. H. Bultman, A. W. Weeber, M. W. Brieko, J. Hoonstra, J. A. Dijkstra, A. C. Tip and F. M. Schuurmans, “Pin Up Module: A Design for Higher Efficiency, Easy Module Fabrication and Attractive Appearance,” Proceedings of the 16th EPVSC, Glasgow, 2000, pp. 1210-1213.
[7] A. Schonecker, A. Weeber, W. Sinke, C. Zechner, A. Kress and P. Fath, “Attacking Limiting Factors in 10 × 10 cm2 Multicrystalline Silicon, Emitter Wrap-through Solar Cell Design and Processing,” Proceedings of the 2nd WCPSEC, Vienna, 1998, pp. 1677-1680.
[8] A. Ghitas and M. Sabry, “Performance of a Large Area Back Contact Silicon Solar Cell in a Desert Zone,” Proceedings of the Cairo 11th International Conference on Energy and Environment, Hurghada, 2009.
[9] J. Trontelj, “Optimization of Integrated Magnetic Sensor by Mixed Signal Processing,” Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference, Vol. 1, 1999, pp. 299-302.
[10] C. C. Xiao, L. Y. Zhao, T. Asada, W. G. Odendaal and J. D. van Wyk, “An Overview of Integratable Current Sensor Technologies,” IEEE Industry Application Conference, Vol. 2, 2003, pp. 1251- 1258.
[11] R. G. Jones, P. Clarkson and A. J. Wheaton, “Calibration of Ac Current Shunts,” Precision Electromagnetic Measurements Digest Conference, Sydney, 2000, pp. 492-493.
[12] H. K. Elminir, A. E. Ghitas, F. El-Hussainy, R. Hamid, M. M. Beheary and K. M. Abdel-Moneim, “Optimum Solar Flat-plate Collector Slope: Case Study for Helwan, Egypt,” Energy Conversion & Management, 2006, Vol. 47, pp. 624-637.
[13] D. E. Destefan, R. S. Stant, “AC and DC Shunts-Can You Believe Their Specs?” IEEE Instrumentation and Measurement Technology Conference, Vol. 2, 2003, pp. 1577-1582.
[14] M. Handbook, “Stainless Steel Materials and Special Purpose Metals,” 9th Edition, American Society for Metals, Detroit, pp. 640-645.
[15] T. E. Lipe, “Operation and Reference Manual for the NIST Automated AC-DC Calibration Systems and Software,” National Institute of Standards and Technology Special Publication, May 2004.
[16] M. Klonz, G. Schliestedt, T. Funck, M. Stojanovic and B. Stojanovic, “Millivolt Calibrations Using Micropotentiometers with New Disc Resistors and Planar MJTCS Aided by New Millivolt Amplifiers,” IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 2, April 2005, pp.787-790.
[17] H. Sasaki, K. Takahashi, B. D. Inglis and M. Klonz, “A Numerical Simulation of Thermoelectric Effects in Single-Junction Thermal Converters,” IEEE Transactions on Instrumentation and Measurement, Vol. 48, No. 2, April 1999, pp. 408-411.

Copyright © 2024 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.