Fault Tolerance Limits and Input Stimulus Selection Using an Implemented FPGA-Based Testing System

Papakostas K. Dimitrios^*, Pouros P. Sotirios, Vassios D. Vassilios

Department of Electronic Engineering T.E, Alexander Technological & Educational Institute of Thessaloniki, Thessaloniki, Greece.

DOI: 10.4236/jcc.2014.213003                

Abstract

In this paper, the selection of fault tolerance limits and input stimulus using an implemented adaptive FPGA-based testing system based on a method utilizing wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the advantages of the proposed testing scheme.

Keywords

Fault Detection, External Testing System

Conflicts of Interest

The authors declare no conflicts of interest.

References

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