Journal of Materials Science and Chemical Engineering
Vol.5 No.2(2017), Paper ID 74175, 7
pages
DOI:10.4236/msce.2017.52004
Photoluminescence and X-Ray Diffraction Properties of Europium and Silver Co-Doped Tantalum-Oxide Thin Films Deposited by Co-Sputtering
Keisuke Shimada, Kenta Miura, Ryosuke Fujii, Masahiro Kanakubo, Wataru Kada, Osamu Hanaizumi
Graduate School of Science and Technology, Gunma University, Kiryu, Japan
Graduate School of Science and Technology, Gunma University, Kiryu, Japan
Graduate School of Science and Technology, Gunma University, Kiryu, Japan
Graduate School of Science and Technology, Gunma University, Kiryu, Japan
Graduate School of Science and Technology, Gunma University, Kiryu, Japan
Graduate School of Science and Technology, Gunma University, Kiryu, Japan
Copyright © 2017 Keisuke Shimada, Kenta Miura, Ryosuke Fujii, Masahiro Kanakubo, Wataru Kada, Osamu Hanaizumi et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Shimada, K. , Miura, K. , Fujii, R. , Kanakubo, M. , Kada, W. and Hanaizumi, O. (2017) Photoluminescence and X-Ray Diffraction Properties of Europium and Silver Co-Doped Tantalum-Oxide Thin Films Deposited by Co-Sputtering.
Journal of Materials Science and Chemical Engineering,
5, 35-40. doi:
10.4236/msce.2017.52004.