Circuits and Systems
Vol.2 No.3(2011), Paper ID 5747, 6 pages
DOI:10.4236/cs.2011.23022
New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits
Wagah Farman Mohammad
Copyright © 2011 Wagah Farman Mohammad et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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