Circuits and Systems

Vol.2 No.3(2011), Paper ID 5747, 6 pages

DOI:10.4236/cs.2011.23022

 

New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits

 

Wagah Farman Mohammad

 

 

Copyright © 2011 Wagah Farman Mohammad et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


W. Mohammad, "New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits," Circuits and Systems, Vol. 2 No. 3, 2011, pp. 145-150. doi: 10.4236/cs.2011.23022.

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