Materials Sciences and Applications

Vol.4 No.12(2013), Paper ID 41132, 8 pages

DOI:10.4236/msa.2013.412103

 

Schottkey Barrier Measurement of Nanocrystalline Lu3N@C80/Au Contact

 

Yong Sun, Yusuke Hattori, Masamichi Sakaino, Fumio Morimoto, Kenta Kirimoto

 

Department of Applied Science for Integrated System Engineering, Kyushu Institute of Technology, Fukuoka, Japan
Department of Applied Science for Integrated System Engineering, Kyushu Institute of Technology, Fukuoka, Japan
Department of Applied Science for Integrated System Engineering, Kyushu Institute of Technology, Fukuoka, Japan
Research Institute, Kyushu Kyoritsu University, Fukuoka, Japan
Department of Electrical and electronic Engineering, Kitakyushu National College of Technology, Fukuoka, Japan

 

Copyright © 2013 Yong Sun, Yusuke Hattori, Masamichi Sakaino, Fumio Morimoto, Kenta Kirimoto et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Y. Sun, Y. Hattori, M. Sakaino, F. Morimoto and K. Kirimoto, "Schottkey Barrier Measurement of Nanocrystalline Lu3N@C80/Au Contact," Materials Sciences and Applications, Vol. 4 No. 12, 2013, pp. 808-815. doi: 10.4236/msa.2013.412103.

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