Institut National des Sciences Appliquées et de Technologie (INSAT), University of Carthage, Laboratoire Matériaux, Mesures et Applications (MMA), Groupe de Recherche en Métrologie des Rayonnements, Tunis, Tunisia
Institut National des Sciences Appliquées et de Technologie (INSAT), University of Carthage, Laboratoire Matériaux, Mesures et Applications (MMA), Groupe de Recherche en Métrologie des Rayonnements, Tunis, Tunisia
University of Carthage, Tunis, Tunisia
Copyright © 2012 Zahra Ben Achour, Oualid Touayar, Nejmeddine Sifi et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Z. Achour, O. Touayar and N. Sifi, "Stability Study of the Metrological Characteristics of a ZnO/PS/C-Si Photodiode (PSiZ) Used as a Transfer,"
Modern Instrumentation, Vol. 1 No. 2, 2012, pp. 21-25. doi:
10.4236/mi.2012.12003.