Donostia International Physics Center (DIPC), Donostia-San Sebastian, Spain
Notredame s.r.l., c/o Physics Department, University of Calabria, Rende, Italy
Physics Department, University of Calabria, Cubo 31C, Rende (Cosenza), Italy
CNR, Istituto di Nanotecnologia NANOTEC, SS di Cosenza, Via P. Bucci Cubo 31/C, Rende (CS), Italy
Centro de Física de Materiales (CSIC/UPV-EHU), Donostia-San Sebastian, Spain
Copyright © 2018 Mohammed S. G. Mohammed, Enzo Cazzanelli, Angela Fasanella, Marco Castriota et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Mohammed, M. , Cazzanelli, E. , Fasanella, A. and Castriota, M. (2018) Silicon Nanocrystals on the Surface of Standard Si Wafers: A Micro-Raman Investigation.
Journal of Materials Science and Chemical Engineering,
6, 104-116. doi:
10.4236/msce.2018.67012.