National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine
National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine
National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Kyiv, Ukraine
V. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, Kyiv, Ukraine
V. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, Kyiv, Ukraine
Copyright © 2018 Hanna V. Dorozinska, Tatyana A. Turu, Olga M. Markina, Glib V. Dorozinsky, Volodymyr P. Maslov et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Dorozinska, H. , Turu, T. , Markina, O. , Dorozinsky, G. and Maslov, V. (2018) Influence of Temperature on the Measuring Accuracy of Devices Based on Surface Plasmon Resonance Phenomenon.
Modern Instrumentation,
7, 1-10. doi:
10.4236/mi.2018.71001.