Journal of Surface Engineered Materials and Advanced Technology
Vol.1 No.2(2011), Paper ID 6174, 7
pages
DOI:10.4236/jsemat.2011.12006
Effect of Annealing on Structural, Morphological, Electrical and Optical Studies of Nickel Oxide Thin Films
Vikas Patil Patil, Shailesh Pawar, Manik Chougule, Prasad Godse, Ratnakar Sakhare, Shashwati Sen, Pradeep Joshi
Materials Research Laboratory, School of Physical Sciences, Solapur University, Solapur-413255, M.S., India
Copyright © 2011 Vikas Patil Patil, Shailesh Pawar, Manik Chougule, Prasad Godse, Ratnakar Sakhare, Shashwati Sen, Pradeep Joshi et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Patil, V. , Pawar, S. , Chougule, M. , Godse, P. , Sakhare, R. , Sen, S. and Joshi, P. (2011) Effect of Annealing on Structural, Morphological, Electrical and Optical Studies of Nickel Oxide Thin Films.
Journal of Surface Engineered Materials and Advanced Technology,
1, 35-41. doi:
10.4236/jsemat.2011.12006.