Circuits and Systems

Vol.2 No.3(2011), Paper ID 5745, 6 pages

DOI:10.4236/cs.2011.23020

 

ΔIDDQ Testing of a CMOS Digital-to-Analog Converter Considering Process Variation Effects

 

Rajiv Soundararajan, Ashok Srivastava, Siva Sankar Yellampalli

 

 

Copyright © 2011 Rajiv Soundararajan, Ashok Srivastava, Siva Sankar Yellampalli et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


R. Soundararajan, A. Srivastava and S. Yellampalli, "ΔIDDQ Testing of a CMOS Digital-to-Analog Converter Considering Process Variation Effects," Circuits and Systems, Vol. 2 No. 3, 2011, pp. 133-138. doi: 10.4236/cs.2011.23020.

Copyright © 2019 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.