Microscopy Research

Vol.2 No.1(2014), Paper ID 42292, 4 pages

DOI:10.4236/mr.2014.21002

 

Microscopic Study of Defect Luminescence between 0.72 - 0.85 eV by Optical Microscopy

 

Dominik Lausch, Christian Hagendorf

 

Fraunhofer Center for Silicon Photovoltaics CSP, Halle, Germany.
Fraunhofer Center for Silicon Photovoltaics CSP, Halle, Germany.

 

Copyright © 2014 Dominik Lausch, Christian Hagendorf et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article

Lausch, D. and Hagendorf, C. (2014) Microscopic Study of Defect Luminescence between 0.72 - 0.85 eV by Optical Microscopy. Microscopy Research, 2, 9-12. doi: 10.4236/mr.2014.21002.
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