RWTH Aachen University, Aachen, Germany
RWTH Aachen University, Aachen, Germany
RWTH Aachen University, Aachen, Germany
Copyright © 2009 Ashraf Armoush, Falk Salewski, Stefan Kowalewski et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
A. Armoush, F. Salewski and S. Kowalewski, "Design Pattern Representation for Safety-Critical Embedded Systems,"
Journal of Software Engineering and Applications, Vol. 2 No. 1, 2009, pp. 1-12. doi:
10.4236/jsea.2009.21001.