Journal of Software Engineering and Applications

Vol.6 No.6(2013), Paper ID 33255, 9 pages

DOI:10.4236/jsea.2013.66038

 

Design a Collector with More Reliability against Defects during Manufacturing in Nanometer Technology, QCA

 

Milad Sang Sefidi, Dariush Abedi, Mehdi Moradian

 

Computer Engineering Department, Sadjad University, Mashhad, Iran
Computer Engineering Department, Shahid Beheshti University, Tehran, Iran
Electrical Engineering Faculty, Sahand University of Technology, Sahand, Iran

 

Copyright © 2013 Milad Sang Sefidi, Dariush Abedi, Mehdi Moradian et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


M. Sefidi, D. Abedi and M. Moradian, "Design a Collector with More Reliability against Defects during Manufacturing in Nanometer Technology, QCA," Journal of Software Engineering and Applications, Vol. 6 No. 6, 2013, pp. 304-312. doi: 10.4236/jsea.2013.66038.

Copyright © 2020 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.