Open Journal of Radiology

Vol.3 No.2(2013), Paper ID 33151, 10 pages

DOI:10.4236/ojrad.2013.32009

 

A GATE Simulation Study of the Siemens Biograph DUO PET/CT System

 

Dimitrios Nikolopoulos, Sofia Kottou, Nikolaos Chatzisavvas, Xenophon Argyriou, Emannouel Vlamakis, Panayiotis Yannakopoulos, Anna Louizi

 

Department of Physics, Chemistry and Material Science, Technological Educational Institute (TEI) of Piraeus, Athens, Greece
Medical Physics Department, Medical School, University of Athens, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational Institute (TEI) of Piraeus, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational Institute (TEI) of Piraeus, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational Institute (TEI) of Piraeus, Athens, Greece
Department of Engineering of Electronic and Computer Systems, Technological Educational Institute (TEI) of Piraeus, Athens, Greece
Medical Physics Department, Medical School, University of Athens, Athens, Greece

 

Copyright © 2013 Dimitrios Nikolopoulos, Sofia Kottou, Nikolaos Chatzisavvas, Xenophon Argyriou, Emannouel Vlamakis, Panayiotis Yannakopoulos, Anna Louizi et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


D. Nikolopoulos, S. Kottou, N. Chatzisavvas, X. Argyriou, E. Vlamakis, P. Yannakopoulos and A. Louizi, "A GATE Simulation Study of the Siemens Biograph DUO PET/CT System," Open Journal of Radiology, Vol. 3 No. 2, 2013, pp. 56-65. doi: 10.4236/ojrad.2013.32009.

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