American Journal of Plant Sciences

Vol.4 No.4(2013), Paper ID 30083, 12 pages

DOI:10.4236/ajps.2013.44108

 

QTL Mapping for Partial Resistance to Southern Corn Rust Using RILs of Tropical Sweet Corn

 

Kitti Wanlayaporn, Jetsada Authrapun, Apichat Vanavichit, Somvong Tragoonrung

 

Interdisciplinary Graduate Program in Genetic Engineering, Kasetsart University, Bangkok, Thailand
Department of Agonomy, Faculty of Agriculture, Kasetsart University, Nakhon Pathom, Thailand
Department of Agonomy, Faculty of Agriculture, Kasetsart University, Nakhon Pathom, Thailand
Genome Institute, National Center for Genetic Engineering and Biotechnology, Pathum Thani, Thailand

 

Copyright © 2013 Kitti Wanlayaporn, Jetsada Authrapun, Apichat Vanavichit, Somvong Tragoonrung et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


K. Wanlayaporn, J. Authrapun, A. Vanavichit and S. Tragoonrung, "QTL Mapping for Partial Resistance to Southern Corn Rust Using RILs of Tropical Sweet Corn," American Journal of Plant Sciences, Vol. 4 No. 4, 2013, pp. 878-889. doi: 10.4236/ajps.2013.44108.

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