Natural Science

Vol.2 No.10(2010), Paper ID 2941, 6 pages

DOI:10.4236/ns.2010.210133

 

Structural and electrical characterization of Bi2VO5.5 / Bi4Ti3O12 bilayer thin films deposited by pulsed laser ablation technique

 

Neelam Kumari, Saluru Baba Krupanidhi, Kalidhindi Balakrishna Raju Varma

 

 

Copyright © 2010 Neelam Kumari, Saluru Baba Krupanidhi, Kalidhindi Balakrishna Raju Varma et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article

Kumari, N. , Krupanidhi, S. and Varma, K. (2010) Structural and electrical characterization of Bi2VO5.5 / Bi4Ti3O12 bilayer thin films deposited by pulsed laser ablation technique. Natural Science, 2, 1073-1078. doi: 10.4236/ns.2010.210133.
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