World Journal of Nuclear Science and Technology

Vol.2 No.4(2012), Paper ID 23799, 7 pages

DOI:10.4236/wjnst.2012.24027

 

New Method for Diagnostics of Ion Implantation Induced Charge Carrier Traps in Micro- and Nanoelectronic Devices

 

Mukhtar Ahmed Rana

 

Physics Department, International Islamic University, Kashmir Highways, Islamabad, Pakistan

 

Copyright © 2012 Mukhtar Ahmed Rana et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


M. Rana, "New Method for Diagnostics of Ion Implantation Induced Charge Carrier Traps in Micro- and Nanoelectronic Devices," World Journal of Nuclear Science and Technology, Vol. 2 No. 4, 2012, pp. 174-180. doi: 10.4236/wjnst.2012.24027.

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