World Journal of Nuclear Science and Technology
Vol.2 No.4(2012), Paper ID 23799, 7 pages
DOI:10.4236/wjnst.2012.24027
New Method for Diagnostics of Ion Implantation Induced Charge Carrier Traps in Micro- and Nanoelectronic Devices
Mukhtar Ahmed Rana
Physics Department, International Islamic University, Kashmir Highways, Islamabad, Pakistan
Copyright © 2012 Mukhtar Ahmed Rana et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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