Circuits and Systems

Vol.3 No.4(2012), Paper ID 23638, 8 pages

DOI:10.4236/cs.2012.34042

 

Challenges in Quality Certification of I/O Libraries

 

Oleg Semenov, Dmitry Vasiounin, Victor Spitsyn

 

Freescale Semiconductor, Moscow, Russia
Freescale Semiconductor, Moscow, Russia
Freescale Semiconductor, Moscow, Russia

 

Copyright © 2012 Oleg Semenov, Dmitry Vasiounin, Victor Spitsyn et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


O. Semenov, D. Vasiounin and V. Spitsyn, "Challenges in Quality Certification of I/O Libraries," Circuits and Systems, Vol. 3 No. 4, 2012, pp. 300-306. doi: 10.4236/cs.2012.34042.

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