Circuits and Systems

Vol.3 No.2(2012), Paper ID 18550, 5 pages

DOI:10.4236/cs.2012.32027

 

Effect of Temperature & Supply Voltage Variation on Stability of 9T SRAM Cell at 45 nm Technology for Various Process Corners

 

Manisha Pattanaik, Shilpi Birla, Rakesh Kumar Singh

 

VLSI Group, Atal Bihari Vajpayee Indian Institute of Information Technology and Management, Gwalior, India
Department of Electronics & Communications, Sir Padampat Singhania University, Udaipur, India
Department of Electronics & Communications, Bipin Chandra Tripathi kumaon Engineering College, Dwarahat, India

 

Copyright © 2012 Manisha Pattanaik, Shilpi Birla, Rakesh Kumar Singh et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


M. Pattanaik, S. Birla and R. Singh, "Effect of Temperature & Supply Voltage Variation on Stability of 9T SRAM Cell at 45 nm Technology for Various Process Corners," Circuits and Systems, Vol. 3 No. 2, 2012, pp. 200-204. doi: 10.4236/cs.2012.32027.

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