Journal of Software Engineering and Applications

Vol.3 No.4(2010), Paper ID 1695, 10 pages

DOI:10.4236/jsea.2010.34041

 

Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns

 

Paloli Mohammed Shareef, Midthe Vijayaraghavan Srinath, Subbiah Balasubramanian

 

Trimentus Technologies, Chennai, India
Mahendra Engineering College, Namakkal, India
Anna University, Coimbatore, India.

 

Copyright © 2010 Paloli Mohammed Shareef, Midthe Vijayaraghavan Srinath, Subbiah Balasubramanian et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


P. Shareef, M. Srinath and S. Balasubramanian, "Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns," Journal of Software Engineering and Applications, Vol. 3 No. 4, 2010, pp. 364-373. doi: 10.4236/jsea.2010.34041.

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