Design and Implementation of an Analogue Tester Board

Abstract

The recent rapid development of electronics and continual increase of the complexity and variety of electronic circuits (chips, packets, micro- and embedded systems) creates a demand for viable test and diagnostic methods. These recent developments have led to a great deal of research interest in electronic diagnostic systems, especially of effective diagnosis methods of detection, localization and identification levels of hard (catastrophic) and soft (parametric) faults in analog circuits. At present, the majority of electronic devices (embedded systems) are designed based on digital circuits; however a lot of them also contain analog components that require more complicated testing techniques. This paper presents a novel, electronic components tester board with inside, outside of circuit under tested. The design is first simulated by using the electronic work-bench software Multisim 11 in order to obtain satisfactory theoretical results for each standalone element of the design. Thereafter, the design is practically implemented and experimentally verified to show agreement with the simulated results.

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Y. Mashhadany, S. Jassam, A. Sami and H. Nassar, "Design and Implementation of an Analogue Tester Board," Circuits and Systems, Vol. 3 No. 3, 2012, pp. 210-215. doi: 10.4236/cs.2012.33029.

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1] Z. Czaja, “Testing of Analog Parts of Electronic Embed- ded Systems with Limited Access to Internal Nodes,” 12th IMEKO TC1 & TC7 Joint Symposium on Man Sci- ence & Measurement, Annecy, 3-5 September 2008, pp. 305-312.
[2] I. Memis, “Testing to Eliminate Reliability Defects from Electronic Pacages,” Endicott Interconnect Technologies, 1701 North St., 2011. irv.memis@eitny.com
[3] B. Betts, “Diagnosing and Fixing Motherboard Faults,” 1997. http://people.richland.edu/dkirby/mbdfaults.pdf
[4] Company Manual, “Front Panel I/O Connectivity Design Guide,” Intel Corporation, Copyright 2000, Order Num- ber A29286-001.
[5] L. Wang and M. S. Abadir, “On Efficiency Producing Quality Tests for Custom Circuits in Power PCTM Micro- processors,” Journal of Electronic Testing: Theory and Applications, Vol. 16, No. 1-2, 1999, pp. 121-130.
[6] Dell South, “Basic Electronics Testing Study Guide,” USA an Equal Opportunity Employer, Copyright?2005 by Bell- South All Rights Reserved.
[7] K. Warren, D. Roth, J. Kinnison and B. Carkuff, “Single Event Latchup and Total Dose Testing of Spacecfat Elec- tronic Components,” Radiation Effects Data Workshop, 2001, pp. 100-105.
[8] H. Livingston, “Avoiding Counterfeit Electronic Com- ponents—Part 2 Observations from Recent Counterfeit Detection Experiences,” BAE Systems Information and Electronic Systems Integration Inc., 2007, pp. 1-4.
[9] J. Yong, “7 Ways on How to Save Your Time for Elec- tronic Repairing Line,” 2011. http://www.Testingelectroniccomponents.com
[10] Altera DE2 Board, “Development and Education Board Getting Started Guide,” Document Version 1.2, 2005.
[11] Instruction Sheet, “Thermo Scientific Orion Electronic Test Kit”, 2011. http://www.thermo.com/eThermo/CMA/PDFs/Various/File_9126.pdf
[12] J. Yong, “How to Solve No Power Problem in HP f1723 LCD Monitor,” 2011. http://ezinearticles.com/?HP-F1723-LCD-Monitor-Repair---No-Power&id=914512

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