Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy

Journals Menu

Follow SCIRP

ISSN Print: 2327-6045
ISSN Online: 2327-6053
www.scirp.org/journal/msce
E-mail: msce@scirp.org

"Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy"
written by Dmitry Filatov, Dmitry Antonov, Ivan Antonov, Alexander Kasatkin, Oleg Gorshkov,
published by Journal of Materials Science and Chemical Engineering, Vol.5 No.1, 2017

has been cited by the following article(s):

[1]	Investigation of Resistive Switching Mechanisms in Ti/TiOx/Pd‐Based RRAM Devices
	Advanced Electronic …, 2022

[2]	The Formation of Nanosized Ferromagnetic Ni Filaments in Films of ZrO2(Y)
	Technical Physics …, 2021

[3]	Резистивное переключение в отдельных ферромагнитных филаментах мемристорных структур на основе ZrO(Y)/Ni
	Журнал технической …, 2021

[4]	Формирование наноразмерных ферромагнитных филаментов Ni в пленках ZrO(Y)
	Письма в Журнал …, 2021

[5]	High performance, electroforming-free, thin film memristors using ionic Na 0.5 Bi 0.5 TiO 3
	2021

[6]	Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor
	2021

[7]	Observation of Quantum-Size Effects in a Study of Resistive Switching in Dielectric Films with Au Nanoparticles via Tunneling Atomic Force Microscopy
	2019

[8]	Наблюдение квантоворазмерных эффектов при исследовании резистивного переключения в диэлектрических пленках с наночастицами Au методом …
	2019

[9]	Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
	Scanning, 2018

[1]	Potentiation and depression behaviour in a two-terminal memristor based on nanostructured bilayer ZrO x /Au films Journal of Physics D: Applied Physics, 2023 DOI:10.1088/1361-6463/acd704

[2]	The Formation of Nanosized Ferromagnetic Ni Filaments in Films of ZrO2(Y) Technical Physics Letters, 2021 DOI:10.1134/S1063785021060043

[3]	Observation of Quantum-Size Effects in a Study of Resistive Switching in Dielectric Films with Au Nanoparticles via Tunneling Atomic Force Microscopy Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2019 DOI:10.1134/S1027451019010063

[4]	Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles Scanning, 2018 DOI:10.1155/2018/5489596

Follow SCIRP