[1]
|
E. Brady and C. Morris, “Whitespace,” 2004.
http://compsoc.dur.ac.uk/whitespace
|
[2]
|
G. Cosma and M. Joy, “Source-Code Plagiarism: A UK Academic Perspective,” Research Report, University of Warwick, Coventry, 2006, pp. 116-120.
|
[3]
|
G. Cosma, “An Approach to Source-Code Plagiarism Detection and Investigation Using Latent Semantic Analysis,” Ph.D. Thesis, University of Warwick, Coventry, 2008.
|
[4]
|
P. J. Plauger, “Fingerprints,” Embedded Systems Programming, Miller Freeman, San Francisco, 1994, pp. 84-87.
|
[5]
|
S. Schleimer, D. Wilkerson and A. Aiken, “Winnowing: Local Algorithms for Document Fingerprinting,” Proceedings of the 2003 SIGMOD International Conference on Management of Data, San Diego, 9-12 June 2003, pp. 76-85.
|
[6]
|
B. Cui, L. Han, Y. Hao, Z. Li, J. Wang and R. Zhang, “Type Redefinition Plagiarism Detection of Token-Based Comparison,” Proceedings of the 2010 International Conference on Multimedia Information Networking and Security of the IEEE Computer Society, Nanjing, 4-6 November 2010, pp. 351-355.
|
[7]
|
G. Malpohl, M. Philippsen and L. Prechelt, “Finding Plagiarisms among a Set of Programs with JPlag,” Journal of Universal Computer Science, Vol. 8, No. 11, 2000, pp. 1016-1038.
|
[8]
|
M. Wise, “YAP3: Improved Detection of Similarities in Computer Program and Other Texts,” Proceedings of the 27th SIGCSE Technical Symposium on Computer Science Education, Philadelphia, 15-18 February 1996, pp. 130-134.
|
[9]
|
C. Anderson and M. Ellis, “Plagiarism Detection in Computer Code,” Rose-Hulman Institute of Technology, Terre Haute, 2005.
|
[10]
|
H. T. Jonkowitz, “Detecting Plagiarism in Student Pascal Programs,” The Computer Journal, Vol. 31, No. 1, 1998, pp. 1-8. doi:10.1093/comjnl/31.1.1
|
[11]
|
E. Merlo, “Detection of Plagiarism in University Projects Using Metrics-Based Spectral Similarity,” Dagstuhl Seminar Proceedings, Dagstuh1, Saarland, 2007.
|
[12]
|
R. Zeidman, “Software Source Code Correlation,” Proceedings of the 5th IEEE/ACIS International Workshop on Component-Based Software Engineering, Honolulu, 10-12 July 2006, pp. 383-392.
doi:10.1109/ICIS-COMSAR.2006.79
|
[13]
|
R. Zeidman, “Multidimensional Correlation of Software Source Code,” Proceedings of the 3rd International Workshop on Systematic Approaches to Digital Forensic Engineering, Oakland, 22-22 May 2008, pp 144-156.
doi:10.1109/SADFE.2008.9
|
[14]
|
H. Li, Z. J. Li, H. H. Yan and H. Xiong, “BUAA_AntiPlagiarism: A System to Detect Plagiarism for C Source Code,” Proceedings of the International Conference on Computational Intelligence and Software Engineering, Wuhan, 11-13 December 2009, pp. 1-5.
doi:10.1109/CISE.2009.5366790
|
[15]
|
U. Bandara and G. Wijayarathna, “A Machine Learning Based Tool for Source Code Plagiarism Detection,” International Journal of Machine Learning and Computing, Vol. 1, No. 4, 2011, pp. 337-343.
|
[16]
|
J. Hamblen and A. Parker, “Computer Algorithms for Plagiarism Detection,” IEEE Transactions on Education, Vol. 32, No. 2, 1989, pp. 94-99. doi:10.1109/13.28038
|
[17]
|
C. Daly and J. Horgan, “A Technique for Detecting Plagiarism in Computer Code,” The Computer Journal, Vol. 48, No. 6, 2005, pp. 662-666.
doi:10.1093/comjnl/bxh139
|
[18]
|
S. Aliefendic, “Using Whitespace Patterns to Detect Plagiarism in Program Code,” School of Computer Science and Informatics University College Dublin, Dublin, 2003.
|
[19]
|
R. Zeidman, “The Software IP Detective’s Handbook: Measurement, Comparison, and Infringement Detection,” Prentice Hall, Boston, 2011
|
[20]
|
B. Baker, “On Finding Duplication and Near-Duplication in Large Software Systems,” Proceedings of the Second Working Conference on Reverse Engineering, Washington DC, 1995, pp. 86-95.
|
[21]
|
I. Shay, N. Baer and R. Zeidman, “Measuring Whitespace Patterns as an Indication of Plagiarism,” Proceedings of the ADFSL Conference on Digital Forensics, Security and Law, St. Paul, 20 May 2010, pp. 63-72.
|
[22]
|
N. Baer and B. Zeidman, “Measuring Software Evolution with Changing Lines of Code,” Proceedings of the 24th International Conference on Computers and Their Applications, New Orleans, 8-10 April 2009, pp. 264-270.
|