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C. F. Cheng, C. X. Liu, N. Y. Zhang, T. Q. Jia, R. X. Li, and Z. Z. Xu, “Absolute Measurement of Roughness and Lateral-Correlation Length of Random Surfaces by Use of the Simplified Model of Image-Speckle Contrast,” Applied Optics, Vol. 41, No. 20, 2002, pp. 4148-4156. doi:10.1364/AO.41.004148

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