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Shtansky D.V., Kaneko K., Ikuhara Y. and Levashov. (2001) Characterization of nanostructured multiphase Ti-Al-B-N thin films with extremely small grain size. Surface and Coatings Technology, 148(2-3), 206-215. doi:10.1016/S0257-8972(01)01341-X

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