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M. Kemdehoundja, J. L. Grosseau, Poussard and J. F. Dinhut, “Raman Microprobe Spectroscopy Measurements of Residual Stress Distribution along Blisters in Cr2O3 Thin Films,” Applied Surface Science, Vol. 256, No. 9, 2010, pp. 2719-2725. doi:10.1016/j.apsusc.2009.11.016

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