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D. H. Kalantar, M. H. Key, L. B. Da Silva, et al., “Measurement of 0. 35 Microm Laser Imprint in a Thin Si Foil Using an X-Ray Laser Backlighter,” Physical Review Letters, Vol. 76, No. 19, 1996, pp. 3574-3577. doi:10.1103/PhysRevLett.76.3574

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