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De Oliveira, R.R.L., Albuquerque, D.A.C., Cruz, T.G.S., Yamaji, F.M. and Leite, F.L. (2012) Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications. In: Bellitto, V., Ed., Atomic Force Microscopy—Imaging, Measuring and Manipulating Surfaces at the Atomic Scale, InTech, Rijeka, 147-174.
https://doi.org/10.5772/37583

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