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Li, H.Y., Du, G.H., Shao, C.P., Dai, L., Xu, G.Q. and Guo, J.L. (2021) Heavy-Ion Microbeam Fault Injection into SRAM-Based FPGA Implementations of Cryptographic Circuits. IEEE Transactions on Nuclear Science, 62, 1341-1348.
https://doi.org/10.1109/TNS.2015.2423672
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