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Yonggang, P., Zhongfu, X., Xiaoquin, Z. and Yewen, Z. (1999) Charge Storage Characteristic for Double Layer of Si/Sub 3/N/Sub 4//SiO/Sub 2/ and Single Layer of Si/Sub 3/N/Sub 4/. 10th International Symposium on Electrets, Delphi, 22-24 September 1999, 391-394.
https://doi.org/10.1109/ISE.1999.832069

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