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Pfeiffer, B., Erichsen, T., Epler, E., Volkert, C.A., Trompenaars, P. and Nowak, C. (2015) Characterization of Nanoporous Materials with Atom Probe Tomography. Microscopy and Microanalysis, 21, 557-563.
https://doi.org/10.1017/S1431927615000501

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