Mirchin, N., Apter, B., Lapsker, I., Fogel, V., Gorodetsky, U., Popescu, S.A., Peled, A., Popescu-Pelin, G., Dorcioman, G., Duta, L., Popescu, A. and Mihailescu, I.N. (2012) Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique. Journal of Nanoscience and Nanotechnology, 12, 2668-2671.
http://dx.doi.org/10.1166/jnn.2012.5788

has been cited by the following article:

• TITLE: A Discrete Model of the Evanescent Light Emission from Ultra-Thin Layers

  AUTHORS: N. Mirchin, E. Tannous, I. Lapsker, A. Laihtman, A. Peled

  KEYWORDS: Evanescent Waves, Light Scattering, Thin Nanofilms, Thickness Profiles, Optical Nanoscopy

  JOURNAL NAME: Journal of Materials Science and Chemical Engineering, Vol.3 No.5, May 7, 2015

  ABSTRACT: A discrete model of the Differential Evanescent Light Intensity (DELI) technique was developed to calculate and map 3D nanolayers thicknesses from the evanescent light intensity captured from optical waveguides. The model was used for ultra-thin Pd nanometric layers sputtered on glass substrates. The layers thickness profiles were displayed in 3D and 1D profiles plots. The total thickness profiles of the ultra-thin Pd films obtained in the range of 1-10 nm were validated using AFM measurements. Based on the model developed the evanescent photon extraction parameter of the material was estimated.