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Duan, X. and Jiang, Y. (2010) Annealing Effects on the Structural and Electrical Transport Properties of N-Type Bi2Te2.7Se0.3 Thin Films Deposited by Flash Evaporation. Applied Surface Science, 256, 7365-7370.
http://dx.doi.org/10.1016/j.apsusc.2010.05.069

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