Article citationsMore>>

Z. Hao, L. Zhichao, T. Lilin, T. Zhimin, L. Litian and L. Zhijian, “Thermal Conductivity Measurements of UltraThin Crystal Silicon Films Using Improved Structure,” 8th International Conference on Solid-State and Integrated Circuit Technology, Shanghai, 23-26 October 2006, pp. 2196-2198.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top